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Modularity and Expansion
In the past, shifting applications would often require the full-scale replacement of. costly measurement systems. Not any more. With the SFT-7000, new applications and configuration requirements are satisfied by substituting one or more of the modular elements designed for this unique, expandable system. Many users find that multiple coating measurement needs can be handled by a single SFT-7000 system and a selection of interchangeable chambers.
It's a simple, cost-effective way to increase productivity. And that's why an investment in Seiko performance today will continue to yield handsome dividends for tomorrow.
Higher Precision
Seiko's proprietary digital filtration (numerical filter) process offers higher precision measurements with the greatest possible accuracy. With this mathematical technique for peak deconvolution, the SFT-7000 can handle a wide range of coating measurement applications without adding or changing commonly-used mechanical filters.
Wide Range of Applications
Interchangeable measuring chambers suit a variety of applications, including: measurement of single, double and triple layer coatings, simultaneous measurement of thickness and composition of binary alloys, coating solution element monitoring, electroless nickel measurement, and plating solution metal content analysis. Plating and coating thickness measurements are possible on connector pins, contacts, lead frames, I.C. packages, metallized ceramics, P.C. boards, recording tape, thin and thick films, and jewelry. An expensive instrument line-up is no longer required to widen your quality control range.
Multiple Data Processing Functions
Statistical quality control software is available in visual, printed and menu-driven formats. Basic statistical functions include average and standard deviation as well as minimum and maximum values and range With the addition of disk drives, functions such as rate of rejection, subgrouping, compare, correlate and others, give you full statistical quality control. Profile and histogram plotting and printing are available and you can store from 40,000 data points in 360 memories to an unlimited number using optional disk drives.
Improved Accuracy and Reliability
Seiko engineers have taken much of the guesswork out of precision coating measurement. With the SFT-7000, speed, accuracy and reliability are highly improved. Programmable auto sample measurement, automatic spectrum and X-Ray intensity selection with override and automatic calibration make the SFT-7000 one of the most reliable systems available. Coordinate correction and position display functions make automatic measurements more precise than ever. Even the condition setting, such as the collimator selection, are protected by fail-safe shutters and automatic size detection and exchange functions, and help eliminate costly errors.
Sophisticated, Yet User-Friendly
The SFT-7000 series is designed to save you time and money by taking full advantage of today's most sophisticated microcomputer technology, The on-board computer is engineered around a 16-bit high-speed (8 MHz) 68000 CPU and comes equipped with a full keyboard and two 640K floppy
disk drives. Two video monitors (12" for data viewing and 10" for part sample viewing or simultaneous data and sample inspection for maximum operating efficiency and control.
A standard system memory records 360 measuring files, expandable to unlimited capacity with optional disk drives. The
The SFT-7000 series also makes it easy to transfer measurement and SFT-7000 series also makes it easy to transfer measurement and statistical data to own PC for further analysis via built-in RS-232-C and IEEE-488 ports.
Seiko's advanced Statistical Quality Control software programs are self-prompting and menu-driven and assure sophisticated results, with both visual and hard-copy output available, even in the hands of non-technical personnel. System operation sequences can be activated in one step by just entering a user- selected identifier. Even system calibration is semi-automatic.
Seiko's SFT-7000. The first user-friendly X-Ray coating thickness measurement system that allows you to economically expand your system as your application requirements become more complex.
Measuring Functions
Single layer measurement.
Double layer measurement.
Simultaneous measurement of thickness and composition of alloys.
Composition measurement.
Electroless Ni measurement.
Triple layer measurement (option)
Plating solution measurement (option)
Density correction feature.
Multi-point calibration
Collimator correction.
Background correction.
Repeat measurement function 1-99 times.
Measuring time 1-999 sec.
Calibration curbe confirmation f u nction.
8Automatic calibration curve function.(With Auto Table)
Auto collimator exchange function.
Ease of Operation
Operator prompting key input
Auto Spectrum data setting.
Auto selection of Numerical Filter.
Auto correction function (Energy & Intensity)
Program protection switch. (Basic, Complete)
Calibration curve files Max. 60 (+60 curves/floppy disk)
Measuring File Function
Sample name entry: Max. 15 characters.
Statistics gathering function.
Report function. (option).
Date entry.
Control limit setting alarm.
Measuring files (non-volatile) Max. 360 including automatic measuring files. (+360/floppy disk)
Statistics Function
Average, standard deviation, maximum value, minimum value, range.
Histogram
Profile
Grouping function
Frequency distribution curve graphics function
Îndividual result delete function
Mernory number Max. 360 (unlimited with floppy disk)
Sample number, total 40,000 (unlimited with floppy disk)
Printing Function: Graphic and alphanumeric.
Auto Table Function (Option)
Measuring points setting: manual mode,
Input mode (numerical)
Pattern repeat function.
Measuring position map display
Setting of reference coordinates for positioning correction.
Measurement position coordinate correction function.
Semi-automatic measuring function.
Automatic table file number: Max. 60 (+60/floppy disk)
System Functions
Stability check.
Spectrum measurement.
Date and time setting.
Collimator/ Intensity procedure.
Various system diagnostics.
Floppy disk copy, formatting, initialization.
Measuring Head Block
Dimensions: 520(W) x 658(D) x 515 (H)mm including head Chassis.
X-ray generator block: X-ray tube (DC45KV, 1 mA fixed) Oil tank (shield type, air-cooled)
X-ray detector: Proportional counter
Sample viewing system: Color CCD type television camera -
Sample stage: Pallet size-X-axis 230mm(9.1 inches) Y-axis 160mm(6-3 inches) Pallet traverseX-axis 220mm(8.7 inches) Y-axis 150mm(5.9 inches) Z-axis 50mm(2.0 inches) Driven by a joystic operated motor d rive.
Safety mechanism: -Fail-sate shutter
X-ray On using a key switch
Door closed LED and a microswitch for detecting an open door
Collimators -. 0 .05 x 0 . 4mm, 0. 1 x 0. 4mm rectangular 0.1, 0.2, 0.3mm diameter circular Auto exchanging system Collimator position auto detection system
Illumination controller: Sample illumination and reticle contrast.
Multi-channel analyzer (MCA)-. 200 channels with dead-time correction.
oWorking time indicator for the X-ray tube.
Controller Block
Dimensions: 605(W) x 61 O(D) x 525(H)mm including the display module.
Sheet type exclusive use keys: Function keys
Numerical keys
Cursor control keys
Autornatic table controls (Optional): Joystick and
positioning buttons.
CPU-. 16bit CPU (68000) 8MHz ROM capacity 1 M byte Static RAM 32Kbyte Dynamic RAM 1 M byte
Alphanumeric full keyboard (option)
Operation CRT: 12 inch computor monitor
80 x 25 character, 640 x 200 pixel
Sample viewing CRT: 10 inch composite color CRT
Sample viewing area 6 x 8mm
Buzzer alarm
External 1/0: -External start-start signal inputs from other instruments.
-Printer- Centronics specification
-Serial 1/0 RS-232-C-for communication with other computors. IEEE-488 (option)
Power supply: AC 10OV, 120:k 10% Transformer is required when used with AC 220V, 240V
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