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Seiko Instruments SFT-157SC X-Ray Fluorescence Coating Measurement System
Information for Reference Only
The SFT-157 fluorescent X-Ray coating thickness gauge features closed circuit TV (CCTV) for detailed viewing of sample areas under measurement, plus convenient monitoring of all operating parameters and measurement data. System operation is menu driven and self prompting. Spectrum and X-Ray intensity selection are fully automatic, with manual overrides. Continuous auto-correction for system stability is provided to prevent X-Ray and spectrum drift. All data in memory is password protected. Filter positioning is automatic to insure the greatest accuracy. The SFT-157 system corrects for variations of density and base material, and offers multi-point calibration. The X-Y sample stage is fully programmable with external focus and motorized joystick controls facilitating manual operation.
info@alternatesystems.com
Alternate Systems
2333 Claridge Circle
Plano, TX 75075 USA
+1-972-964-3124
FAX +1-972-423-5464
WATS 800-928-XRAY
©Copyright 1997, 1998, 1999, 2000, 2001 by Alternate Systems
All rights reserved.
Connector Pins / Au, Ni, Ag, Pd, Rh, Sn
Contacts / Au, Ag, Pd, Rh
Lead frames / Au, Ag, Sn, Sn-Pb, Al, Ni
IC Packages / W, Ni, Au, Sn, Sn-Pb, Al
PC Boards / Au, Ni, Cu, Sn, Sn-Pb
Recording Tape / Hard and Floppy disks Fe2O3, Co, Ni
Thin Films, Thick Films / Au, Pt, Ni-Cr, Ta, Pd-Ag
Jewelry / Au, Ag, Rh, Karat composition
And More!
Specifications
Controller Unit
13" color CCTV monitor
Built-in 24 character printer
Built-in joystick stage control
16 channel non-volatile program memory
16 channel non-volatile statistics memory
16 channel non-volatile stage program memory
Dual two-way RS-232C ports for external computer
Parallel output for printer
Multi-channel analyzer with dead time correction
Measurement Head Unit
Measurement time selectable 1 to 999 seconds, with multiple repeat function
Easy access type sample stage 100 x 200ram programmable X,Y
200mm X, 100mm Y, 38mm Z travel
Sample observations by TV camera, 40 x magnffication
X-Ray generation with Air-cooled X-Ray tube in sealed enclosure, 45KV DC voltage, 1 mA (max) current, and run time indicator
Collimators on dampened fail-safe shutter with apertures of 4, 8, 12, 20, 40 mil (0.1, 0.2, 0.3, 0.5, 1.0 mm) diameter
X-Ray detection by proportional counter
Cobalt filter for Ni/Cu, Cu/Ni measurements
Lockable enclosure door
Measurement Modes
Thickness of single layer, double layer
Thickness and weight percentage of binary alloys
Binary alloy measurement
Count-rate--cts/sec
Spectrum with scale adjustment
Statistics
Mean value, standard deviation, minimum-maximum value, range
Histogram
Profile, tolerance alarm
16 memories for statistics data storage
Physical Requirements
100, 120, 200 240 VAC
Controller: 450W x 550D x 410H (mm), 31 (kg)
Measurement head: 530W x 380D x 525H (mm), 68 (kg)
Optional Accessories
Printer: 80 column dot matrix